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Memory Test Socket
Provides optimized solution for all memory device/PKG and different test environments,
from the smallest pitch ~ normal pitch (0.2P~1.0P).
Specifications
| Package Type | BGA, LGA, POP etc. |
| Available Pitch | 0.2P~ |
| Characteristics | - Long life span. - Low Cres, Low Contact force (Multi-PARA) - High Speed, Low Powder, High Voltage Test Solution - No Ball Damage - Available For ESD |
