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Memory Test Socket
極小Pitch~NormalPitch(0.2P~1.0P)まで、すべてのMemoryDevice/PKGおよび様々なTest環境に合わせた最適化されたSolutionをご提供します。
Specifications Package TypeBGA, LGA, POP etc.
Available Pitch0.2P~
CharacteristicsLong life span.
Low Cres, Low Contact force (Multi-PARA)
High Speed, Low Powder, High Voltage Test Solution
No Ball Damage
Available For ESD